Optimal truncated repetitive lot inspection with defect rates

  1. Pérez-González, C.J. 1
  2. Fernández, A.J. 1
  3. Kohansal, A. 2
  4. Asgharzadeh, A. 3
  1. 1 Universidad de La Laguna
    info

    Universidad de La Laguna

    San Cristobal de La Laguna, España

    GRID grid.10041.34

  2. 2 Department of Statistics, Imam Khomeini International University
  3. 3 Department of Statistics, Faculty of Mathematical Sciences, University of Mazandaran
Journal:
Applied Mathematical Modelling

ISSN: 0307-904X

Year of publication: 2019

Volume: 75

Pages: 223-235

Type: Article

Export: RIS
DOI: 10.1016/j.apm.2019.05.032 SCOPUS: 2-s2.0-85066466606 GOOGLE SCHOLAR
Data source: Scopus