Optimal truncated repetitive lot inspection with defect rates
- Pérez-González, C.J.
- Fernández, A.J.
- Kohansal, A.
- Asgharzadeh, A.
Revue:
Applied Mathematical Modelling
ISSN: 0307-904X
Année de publication: 2019
Volumen: 75
Pages: 223-235
Type: Article