Forensic analysis of Si-based PV module micro-cracking due to standard IEC thermal and mechanical testing procedures

  1. Gonzalez, O.
  2. Diaz-Herrera, B.
  3. Gonzalez-Diaz, B.
  4. Gonzalez-Perez, S.
  5. Votta, L.
  6. Guerrero-Lemus, R.
Proceedings:
2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017

ISBN: 9781509056057

Year of publication: 2017

Pages: 1-5

Type: Conference paper

DOI: 10.1109/PVSC.2017.8366721 GOOGLE SCHOLAR
Data source: Scopus