X-ray photoelectron spectroscopy: Surface and depth profiling studies of glasses doped with Nd and Yb ions

  1. Rivera-López, F.
  2. Pérez, M.
Journal:
Surface and Interface Analysis

ISSN: 0142-2421 1096-9918

Year of publication: 2012

Volume: 44

Issue: 8

Pages: 927-930

Type: Conference paper

DOI: 10.1002/SIA.4921 GOOGLE SCHOLAR