Lifetime measurements of porous Si1-xGex stain etched

  1. Guerrero-Lemus, R.
  2. Ben-Hander, F.A.
  3. Kenanoglu, A.
  4. Borchert, D.
  5. Sangrador, J.
  6. Rodríguez, T.
  7. Martínez-Duart, J.M.
Journal:
Thin Solid Films

ISSN: 0040-6090

Year of publication: 2004

Volume: 451-452

Pages: 316-319

Type: Conference paper

DOI: 10.1016/J.TSF.2003.11.056 GOOGLE SCHOLAR