TY  - JOUR
AU  - Ferreira, A.A.L.
AU  - Horovistiz, A.L.
AU  - Abrantes, J.C.C.
AU  - Pérez-Coll, D.
AU  - Núñez, P.
AU  - Frade, J.R.
T1  - De-convolution of bulk and interfacial contributions based on impedance spectroscopy with external load resistance
LA  - eng
PY  - 2009
SP  - 884
EP  - 888
T2  - Materials Research Bulletin
SN  - 0025-5408
VL  - 44
IS  - 4
AB  - De-convolution of impedance spectra is often ambiguous, mainly due to overlapped contributions, or when a prevailing interfacial contribution raises uncertainties about much smaller bulk contributions at higher frequencies. This can be avoided by performing impedance spectroscopy with a parallel external load resistance, which might exert selective decrease in interfacial contributions, with much smaller changes on high frequency contributions. By suitable selection of a parallel load resistance one obtained clearer interpretation for incompletely resolved high capacitance contributions, especially when the frequency range of the equipment does not reach sufficiently low frequencies. This method is discussed in detail and applied to de-convolution of impedance spectra of selected study cases. This includes ionic, or mixed conductors based on Yb2Ti2O7, CGO and strontium titanate. One also provides guidelines for selection of suitable ranges of external resistors. © 2008 Elsevier Ltd. All rights reserved.
DO  - 10.1016/j.materresbull.2008.09.001
UR  - https://portalciencia.ull.es/documentos/5e3c355e29995246bbf5d4ff
DP  - Dialnet - Portal de la Investigación
ER  -