De-convolution of bulk and interfacial contributions based on impedance spectroscopy with external load resistance
- Ferreira, A.A.L. 1
- Horovistiz, A.L. 2
- Abrantes, J.C.C. 12
- Pérez-Coll, D. 3
- Núñez, P. 3
- Frade, J.R. 2
- 1 UIDM, ESTG, Polytechnic Institute of Viana do Castelo
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2
Universidade de Aveiro
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3
Universidad de La Laguna
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Revue:
Materials Research Bulletin
ISSN: 0025-5408
Année de publication: 2009
Volumen: 44
Número: 4
Pages: 884-888
Type: Article
La source de données: Scopus