Laser desorption time-of-flight mass spectrometry of atomic switch memory Ge2Sb2Te5 bulk materials and its thin films

  1. Houška, J.
  2. Peña-Méndez, E.M.
  3. Kolář, J.
  4. Přikryl, J.
  5. Pavlišta, M.
  6. Frumar, M.
  7. Wágner, T.
  8. Havel, J.
Revue:
Rapid Communications in Mass Spectrometry

ISSN: 0951-4198

Année de publication: 2014

Volumen: 28

Número: 7

Pages: 699-704

Type: Article

DOI: 10.1002/RCM.6833 GOOGLE SCHOLAR