Novel characterization of borosilicate transparent wafers by using wave front phase imaging
- Jimenez-Gomis, M.
- Trujillo-Sevilla, J.
- Pauliac-Vaujour, S.
- Castro-Luis, G.
- Ivanov-Kurtev, K.
- Rodríguez-Ramos, J.M.
ISSN: 1605-7422
ISBN: 9781510684065
Year of publication: 2025
Quantitative Phase Imaging XI
Volume: 13329
Type: Conference paper