Advanced Functional Materials and Nanoscience
AFM-NANO
Friedrich Schiller University Jena
Jena, AlemaniaFriedrich Schiller University Jena-ko ikertzaileekin lankidetzan egindako argitalpenak (1)
2020
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Influence of the epitaxial composition on N-face GaN KOH etch kinetics determined by ICP-OES
Beilstein Journal of Nanotechnology, Vol. 11, pp. 41-50