Research institute
INM institute
Conference papers (3) Publications in which a researcher has participated
2000
-
Depth-resolved microspectroscopy of porous silicon multilayers
Materials Research Society Symposium - Proceedings
-
Depth-resolved microspectroscopy of porous silicon multilayers
OPTICAL MICROSTRUCTURAL CHARACTERIZATION OF SEMICONDUCTORS
-
Effect of temperature-dependent multiple reflections in crystals using a high-accuracy universal polarimeter
Proceedings of SPIE - The International Society for Optical Engineering