Biltzar ekarpenak (3) Ikertzaileren baten partaidetza izan duten argitalpenak

2000

  1. Depth-resolved microspectroscopy of porous silicon multilayers

    OPTICAL MICROSTRUCTURAL CHARACTERIZATION OF SEMICONDUCTORS

  2. Depth-resolved microspectroscopy of porous silicon multilayers

    Materials Research Society Symposium - Proceedings

  3. Effect of temperature-dependent multiple reflections in crystals using a high-accuracy universal polarimeter

    Proceedings of SPIE - The International Society for Optical Engineering