Ikerketa institutua
Instituto Universitario de Materiales y Nanotecnología
Biltzar ekarpenak (3) Ikertzaileren baten partaidetza izan duten argitalpenak
2000
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Depth-resolved microspectroscopy of porous silicon multilayers
OPTICAL MICROSTRUCTURAL CHARACTERIZATION OF SEMICONDUCTORS
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Depth-resolved microspectroscopy of porous silicon multilayers
Materials Research Society Symposium - Proceedings
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Effect of temperature-dependent multiple reflections in crystals using a high-accuracy universal polarimeter
Proceedings of SPIE - The International Society for Optical Engineering