Improved time-censored reliability test plans for k-out-of-n gamma systems

  1. Fernández, A.J.
  2. Pérez-González, C.J.
  3. Kohansal, A.
Aldizkaria:
Journal of Computational and Applied Mathematics

ISSN: 0377-0427

Argitalpen urtea: 2019

Alea: 361

Orrialdeak: 42-54

Mota: Artikulua

DOI: 10.1016/J.CAM.2019.04.021 GOOGLE SCHOLAR
Datuen iturria: Scopus