BAM: Bias assignment method to generate mock catalogues
- Balaguera-Antolínez, A.
- Kitaura, F.-S.
- Pellejero-Ibáñez, M.
- Zhao, C.
- Abel, T.
ISSN: 1745-3933, 1745-3925
Année de publication: 2019
Volumen: 483
Número: 1
Pages: L58-L63
Type: Article
Revue:
Monthly Notices of the Royal Astronomical Society: Letters