Influence of wavelength on the Raman line shape in porous silicon

  1. Agulló-Rueda, F.
  2. Moreno, J.D.
  3. Montoya, E.
  4. Guerrero-Lemus, R.
  5. Martínez-Duart, J.M.
Revue:
Journal of Applied Physics

ISSN: 0021-8979

Année de publication: 1998

Volumen: 84

Número: 4

Pages: 2349-2351

Type: Article

DOI: 10.1063/1.368303 GOOGLE SCHOLAR