Applications of high-resolution EELS near-edge structures in complex oxides

  1. Radtke, G.
  2. Maunders, C.
  3. Lazar, S.
  4. Lozano-Gorrin, A.D.
  5. Greedan, J.E.
  6. Botton, G.A.
Journal:
Microscopy and Microanalysis

ISSN: 1431-9276 1435-8115

Year of publication: 2006

Volume: 12

Issue: SUPPL. 2

Pages: 114-115

Type: Conference paper

DOI: 10.1017/S1431927606068103 GOOGLE SCHOLAR

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