Enhanced Lot Acceptance Testing Based on Defect Counts and Posterior Odds Ratios

  1. Fernández, A.J.
Aldizkaria:
Axioms

ISSN: 2075-1680

Argitalpen urtea: 2022

Alea: 11

Zenbakia: 11

Mota: Artikulua

DOI: 10.3390/AXIOMS11110604 GOOGLE SCHOLAR lock_openSarbide irekia editor
Datuen iturria: Scopus