Depth-resolved microspectroscopy of porous silicon multilayers

  1. Manotas, S
  2. Agulló-Rueda, F
  3. Moreno, JD
  4. Martín-Palma, RJ
  5. Guerrero-Lemus, R
  6. Martínez-Duart, JM
Collection de livres:
OPTICAL MICROSTRUCTURAL CHARACTERIZATION OF SEMICONDUCTORS
  1. Unlu, MS (coord.)
  2. Piqueras, J (coord.)
  3. Kalkhoran, NM (coord.)
  4. Sekiguchi, T (coord.)

ISSN: 0272-9172

ISBN: 1-55899-496-3

Année de publication: 2000

Volumen: 588

Pages: 155-160

Congreso: Symposium on Optical Microstructural Characterization of Semiconductors held at the 1999 MRS Fall Meeting

Type: Communication dans un congrès

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La source de données: WoS