X-ray diffraction, thermal analysis, and Raman scattering study of and comparison to other members of the family with ferroelectric-paraelectric transitions
- Solans, X.
- Gonzalez-Silgo, C.
ISSN: 1550-235X, 1098-0121
Datum der Publikation: 1998
Ausgabe: 57
Nummer: 9
Seiten: 5122-5125
Art: Artikel