X-ray diffraction, thermal analysis, and Raman scattering study of and comparison to other members of the family with ferroelectric-paraelectric transitions
- Solans, X.
- Gonzalez-Silgo, C.
ISSN: 1550-235X, 1098-0121
Year of publication: 1998
Volume: 57
Issue: 9
Pages: 5122-5125
Type: Article