A One-Step Deposition Method Assisted with Non Polar Washing Solvent Treatment to Produce Uniform Thin Layers of Perovskite Validated through Ellipsometry
- Cendagorta, M.
- Friend, M.
- Hernandez-Rodriguez, C.
- González-Diaz, B.
- González-Pérez, S.
- Quinto, C.
- Ocaña, L.
- Montes, C.
Editorial: WIP
ISBN: 3-936338-47-7
Ano de publicación: 2017
Páxinas: 1181-1185
Tipo: Achega congreso
Resumo
The present work summarizes the methodology developed by the laboratory of solar cells (SiCelLab) from the Instituto Tecnológico y de Energías Renovables (Canary Islands, Spain), which has been validated by the use of spectral ellipsometry characterization, in order to evaluate the optical properties and the thickness of thin films of methylammonium lead iodide (CH3NH3PBI3), deposited from solutions of their chemical precursors, via spin coating over glass substrates by the one-step method, assisted with non polar washing solvent treatment. The application of this methodology has lead to produce samples with a high degree of uniformity and repetitiveness.