Accurate estimation of aberrations of microoptics components through intensity measurements: Numerical simulations for best positioning and noise analysis

  1. Soto, M.
  2. Ríos, S.
  3. Acosta, E.
  4. Voitsekhovich, V.
Revista:
Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

ISSN: 0021-4922

Any de publicació: 2000

Volum: 39

Número: 3 B

Pàgines: 1562-1565

Tipus: Article

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Font de les dades: Scopus