Optimal truncated repetitive lot inspection with defect rates
- Pérez-González, C.J.
- Fernández, A.J.
- Kohansal, A.
- Asgharzadeh, A.
Aldizkaria:
Applied Mathematical Modelling
ISSN: 0307-904X
Argitalpen urtea: 2019
Alea: 75
Orrialdeak: 223-235
Mota: Artikulua