A large deviation approach to normality testing
- Sigut, J
- Pineiro, J
- Moreno, L
- Estevez, J
- Aguilar, R
- Marichal, R
ISSN: 0033-5207
Year of publication: 2005
Volume: 50
Issue: 6
Pages: 677-680
Type: Article
ISSN: 0033-5207
Year of publication: 2005
Volume: 50
Issue: 6
Pages: 677-680
Type: Article