Depth-resolved microspectroscopy of porous silicon multilayers

  1. Manotas, S.
  2. Agulló-Rueda, F.
  3. Moreno, J.D.
  4. Martín-Palma, R.J.
  5. Guerrero-Lemus, R.
  6. Martinez-Duart, J.M.
Revue:
Applied Physics Letters

ISSN: 0003-6951

Année de publication: 1999

Volumen: 75

Número: 7

Pages: 977-979

Type: Article

DOI: 10.1063/1.124572 GOOGLE SCHOLAR
La source de données: Scopus