Fault diagnosis with Coloured Petri Nets using Latent Nestling Method

  1. García, E.
  2. Rodriguez, L.
  3. Morant, F.
  4. Correcher, A.
  5. Quiles, E.
  6. Blasco, R.
Proceedings:
IEEE International Symposium on Industrial Electronics

ISBN: 9781424416653

Year of publication: 2008

Pages: 986-991

Type: Conference paper

DOI: 10.1109/ISIE.2008.4677094 GOOGLE SCHOLAR
Data source: Scopus