Fault Diagnosis with Coloured Petri Nets using Latent Nestling Method

  1. Garcia, E.
  2. Rodriguez, L.
  3. Morant, F.
  4. Correcher, A.
  5. Quiles, E.
  6. Blasco, R.
Book Series:
2008 IEEE INTERNATIONAL SYMPOSIUM ON INDUSTRIAL ELECTRONICS, VOLS 1-5

ISSN: 2163-5137

ISBN: 978-1-4244-1665-3

Year of publication: 2008

Pages: 1265-1270

Congress: IEEE International Symposium on Industrial Electronics

Type: Conference paper

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Data source: WoS