Fault Diagnosis with Coloured Petri Nets using Latent Nestling Method

  1. Garcia, E.
  2. Rodriguez, L.
  3. Morant, F.
  4. Correcher, A.
  5. Quiles, E.
  6. Blasco, R.
Collection de livres:
2008 IEEE INTERNATIONAL SYMPOSIUM ON INDUSTRIAL ELECTRONICS, VOLS 1-5

ISSN: 2163-5137

ISBN: 978-1-4244-1665-3

Année de publication: 2008

Pages: 1265-1270

Congreso: IEEE International Symposium on Industrial Electronics

Type: Communication dans un congrès