Publicaciones en las que colabora con J.M. Trujillo Sevilla (8)

2021

  1. New metrology technique for measuring wafer geometry on a full 300mm silicon wafer

    Proceedings of SPIE - The International Society for Optical Engineering

  2. Stria measurement using wave front phase imaging on a transparent plate

    Proceedings of SPIE - The International Society for Optical Engineering

2018

  1. Privacy-enabled displays

    Proceedings of SPIE - The International Society for Optical Engineering

  2. Weighted nonnegative tensor factorization for atmospheric tomography reconstruction

    Astronomy and Astrophysics, Vol. 614

2017

  1. Focus measurement in 3D focal stack using direct and inverse discrete radon transform

    Proceedings of SPIE - The International Society for Optical Engineering

2015

  1. Lightfield super-resolution through turbulence

    Proceedings of SPIE - The International Society for Optical Engineering