Forensic analysis of Si-based PV module micro-cracking due to standard IEC thermal and mechanical testing procedures

  1. Gonzalez, O. 1
  2. Diaz-Herrera, B. 1
  3. Gonzalez-Diaz, B. 2
  4. Gonzalez-Perez, S. 2
  5. Votta, L. 3
  6. Guerrero-Lemus, R. 2
  1. 1 Sigma Energy Consulting Corporation S.L.
  2. 2 Universidad de La Laguna

    Universidad de La Laguna

    San Cristobal de La Laguna, España

    GRID grid.10041.34

  3. 3 Kiwa Cermet Italia S.p.A.
Conference Record of the IEEE Photovoltaic Specialists Conference

Publisher: Institute of Electrical and Electronics Engineers Inc.

ISSN: 0160-8371

ISBN: 9781509027248

Year of publication: 2016

Volume: 2016-November

Pages: 3041-3045

Type: Conference paper

Export: RIS
DOI: 10.1109/PVSC.2016.7750223 SCOPUS: 2-s2.0-85003502848 GOOGLE SCHOLAR
Data source: Scopus