Imaging the origins of coating degradation and blistering caused by electrolyte immersion assisted by SECM

  1. Souto, R.M. 1
  2. González-García, Y. 1
  3. González, S. 1
  4. Burstein, G.T. 2
  1. 1 Universidad de La Laguna
    info

    Universidad de La Laguna

    San Cristobal de La Laguna, España

    GRID grid.10041.34

  2. 2 University of Cambridge
    info

    University of Cambridge

    Cambridge, Reino Unido

    GRID grid.5335.0

Journal:
Electroanalysis

ISSN: 1040-0397

Year of publication: 2009

Volume: 21

Issue: 23

Pages: 2569-2574

Type: Article

Export: RIS
DOI: 10.1002/elan.200900262 SCOPUS: 2-s2.0-71649111451 GOOGLE SCHOLAR
Data source: Scopus