Cross-section TEM and optical characterization of porous silicon multilayer stacks

  1. Martín-Palma, R.J.
  2. Herrero, P.
  3. Guerrero-Lemus, R.
  4. Moreno, J.D.
  5. Martínez-Duart, J.M.
Journal:
Journal of Materials Science Letters

ISSN: 0261-8028

Year of publication: 1998

Volume: 17

Issue: 10

Pages: 845-847

Type: Article

DOI: 10.1023/A:1006654926348 GOOGLE SCHOLAR
Data source: Scopus