Cross-section TEM and optical characterization of porous silicon multilayer stacks

  1. Martín-Palma, R.J.
  2. Herrero, P.
  3. Guerrero-Lemus, R.
  4. Moreno, J.D.
  5. Martínez-Duart, J.M.
Aldizkaria:
Journal of Materials Science Letters

ISSN: 0261-8028

Argitalpen urtea: 1998

Alea: 17

Zenbakia: 10

Orrialdeak: 845-847

Mota: Artikulua

DOI: 10.1023/A:1006654926348 GOOGLE SCHOLAR