X-ray photoelectron spectroscopy: Surface and depth profiling studies of glasses doped with Nd and Yb ions

  1. Rivera-López, F.
  2. Pérez, M.
Revue:
Surface and Interface Analysis

ISSN: 0142-2421,  1096-9918

Année de publication: 2012

Volumen: 44

Número: 8

Pages: 927-930

Type: Communication dans un congrès

DOI: 10.1002/SIA.4921 GOOGLE SCHOLAR
La source de données: Scopus