Role of microstructure and layer thickness in porous silicon conductometric gas sensors

  1. Gaburro, Z.
  2. Oton, C.J.
  3. Ghulinyan, M.
  4. Pancheri, L.
  5. Pavesi, L.
  6. Capuj, N.
Revue:
Physica Status Solidi (A) Applications and Materials Science

ISSN: 1862-6300,  1862-6319

Année de publication: 2005

Volumen: 202

Número: 8

Pages: 1467-1471

Type: Communication dans un congrès

DOI: 10.1002/PSSA.200461138 GOOGLE SCHOLAR
La source de données: Scopus