Ingeniería Industrial
Fachbereich
![Foto de J.M.](/img/nophoto.png)
J.M.
Trujillo Sevilla
Publikationen, an denen er mitarbeitet J.M. Trujillo Sevilla (37)
2024
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Comparing the clinical applicability of wavefront phase imaging in keratoconus versus normal eyes
Scientific Reports, Vol. 14, Núm. 1
2023
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Circularly symmetric nanopores in 3D femtosecond laser nanolithography with burst control and the role of energy dose
Nanophotonics, Vol. 12, Núm. 8, pp. 1511-1525
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Real-Time Wavefront Sensing at High Resolution with an Electrically Tunable Lens
Sensors, Vol. 23, Núm. 15
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Refractive index estimation in biological tissues by quantitative phase imaging
Optical Materials, Vol. 142
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Ultra-High Resolution Optical Aberrometry in Patients with Keratoconus: A Cross-Sectional Study
Ophthalmology and Therapy, Vol. 12, Núm. 3, pp. 1569-1582
2022
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A Theoretical Method for Removal of Gravity-Induced Effects in Silicon Wafer Geometry Measurements
Applied Sciences (Switzerland), Vol. 12, Núm. 18
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A two-layers automultiscopic display as a resistant device to shoulder-surfing attacks
Óptica pura y aplicada, Vol. 55, Núm. 4
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New high repeatability wafer geometry measurement technique for full 200mm and 300mm blank wafers
Proceedings of SPIE - The International Society for Optical Engineering
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Stereo occlusion enhancement by the use of semantic information and monocular depth estimation
Optics InfoBase Conference Papers
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Wave front phase imaging for silicon wafer metrology
Proceedings of SPIE - The International Society for Optical Engineering
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Wavefront phase measurement of striae in optical glass
Applied Optics, Vol. 61, Núm. 14, pp. 3912-3918
2021
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New metrology technique for measuring wafer geometry on a full 300mm silicon wafer
Proceedings of SPIE - The International Society for Optical Engineering
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Stria measurement using wave front phase imaging on a transparent plate
Proceedings of SPIE - The International Society for Optical Engineering
2020
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Global piston restoration of segmented mirrors with recurrent neural networks
OSA Continuum, Vol. 3, Núm. 5, pp. 1355-1363
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High speed roughness measurement on blank silicon wafers using wave front phase imaging
Proceedings of SPIE - The International Society for Optical Engineering
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New high-resolution wave ophthalmic instrument for the characterizing ocular optics
Progress in Biomedical Optics and Imaging - Proceedings of SPIE
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Towards piston fine tuning of segmented mirrors through reinforcement learning
Applied Sciences (Switzerland), Vol. 10, Núm. 9
2019
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Calibration method applied to a tunable tensor display system
Proceedings of SPIE - The International Society for Optical Engineering
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High-resolution wave front phase sensor for silicon wafer metrology
Proceedings of SPIE - The International Society for Optical Engineering
2018
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Analyzing the impact of the initialization for the nonnegative tensor factorization in tensor displays
Optical Engineering, Vol. 57, Núm. 6